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Optical Metrology Adapts for Nanoscale Measurements

机译:光学计量学适用于纳米级测量

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As we venture into the nanoscale region, it becomes increasingly necessary to characterize not just new materials, but some of the more familiar ones, because at those dimensions, their characteristics often alter.rnAlain Diebold, Empire Innovation Professor of Nanoscale Science at the College of Nanoscale Science and Engineering (Albany, N.Y.), is developing a research laboratory that will investigate future nanoscale metrology needs. He is looking at various optical technologies, both old and new — some in their linear mode and others in a non-linear fashion. "Ellipsometry is an example of a linear optical measurement," he said. "You send in a certain wavelength, and then look at it coming out."
机译:随着我们进入纳米级地区,越来越不仅要表征新材料,而且还要表征一些更熟悉的材料,因为在这些尺寸上,它们的特性通常会发生变化。rnAlainDiebold,帝国大学纳米级科学创新教授纳米科学与工程(纽约州阿尔巴尼)正在开发一个研究实验室,它将研究未来的纳米计量需求。他正在研究各种新旧光学技术-有些以线性模式出现,而另一些则以非线性方式出现。他说:“椭圆偏振法是线性光学测量的一个例子。” “您发送一定波长的光,然后观察它发出的光。”

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