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Use of Probes to Measure Static Potential in High Vacuum Electron Devices

机译:使用探针测量高真空电子设备中的静电势

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Design factors are considered for the use of emitting and nonemitting metallic probes for measuring static potential in electron streams. Both unneutralized streams and those neutralized by positive ions in a field free drift space are considered. Experimental results are given for potential measurements in a cylindrical diode and in a beam type tube. Good agreement with theory is found for the radial potential distribution in the diode using either probe. The emitting probe gives best results but is more complex in construction and circuitry. Qualitative agreement with theory is found for axial and radial potential distribution in a neutralized cylindrical electron beam.
机译:在使用发射和不发射金属探针测量电子流中的静电势时,应考虑设计因素。既考虑未中和的流,又考虑在无场漂移空间中被正离子中和的流。给出了在圆柱形二极管和束型管中进行电势测量的实验结果。对于使用任一探针的二极管中的径向电势分布,都与理论有很好的一致性。发射探针可提供最佳结果,但结构和电路更为复杂。在中和的圆柱电子束中,发现了轴向和径向电势分布与理论的定性一致性。

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