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Semiconductor Processing Equipment

机译:半导体加工设备

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This research disclosure relates lo a collector protection gas delivery syslem which is applicable to, but not limited to sources of EUV radiation such as used in conjunction with EUV lithographic scanners. Lithographic scanners, in particular EUV scanners, comprise a radiation source and a lithographic apparatus. The radiation source is configured to generate an extreme ultraviolet (EUV) radiation beam. The radiation source may be a type referred to as a laser produced plasma source. A laser, which may for example be a CO_2 laser, is arranged to deposit energy via a laser beam into a fuel, such as tin (Sn) which is provided from a fuel emitter. Although tin is most commonly used, any suitable fuel may be used. The fuel may for example be in liquid form, and may for example be a metal or alloy. Droplets of fuel are emitted from the fuel emitter and a laser is incident upon the fuel droplets which creates a plasma. Radiation, including EUV radiation, is emitted from the plasma during de-excitation and recombination of ions of the plasma.
机译:本研究公开涉及用于适用于但不限于与EUV光刻扫描仪结合使用的EUV辐射的来源的收集器保护气体输送系统。光刻扫描仪,特别是EUV扫描仪,包括辐射源和光刻设备。辐射源被配置为产生极端紫外(EUV)辐射束。辐射源可以是称为激光产生的等离子体源的类型。可以例如是CO_2激光的激光器被布置成通过激光束沉积能量,进入燃料,例如由燃料发射器提供的锡(Sn)。尽管最常使用锡,但是可以使用任何合适的燃料。燃料可以例如是液体形式,并且例如可以是金属或合金。从燃料发射器发射燃料液滴,激光器入射到产生等离子体的燃料液滴上。辐射,包括EUV辐射,在血浆的去激发和重组等离子体中的血浆中排出。

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    《Research Disclosure》 |2020年第678期|2837-2838|共2页
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