Third generation XAFS using insertion devices: new Oppoutunities of high brilliance photon sources

摘要

We review the recent X-ray absorption fine structure (XAFS) studies using high brilliance photon sources. Owing to the use of insertion devices and dense-packed solid- state detector arrays, efficiency in fluorescence excitation and detection has been greatly improved, allowing us to probe dynamic aspects of electron states of solids. The advantage of XAFS is that the local atomic arrangements for dilute atoms (10~10/cm~3 or 10~14/cm~2) can be probed with a time scale of 10~-15 sec.