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An npn Transistor Tester

机译:NPN晶体管测试仪

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A frequently-used method of checking that an npn transistor is not faulty involves measuring the resistance of its p-n junctions, ie between the base and emitter and the base and collector. These resistance values should be low when the junction is forward-biased (anode positive, cathode negative), and high when reverse-biased (anode negative, cathode positive). Additionally, the measured resistance between the collector and emitter should always be high since, whatever the polarity of the test voltage, one of the two 'back-to-back' junctions will always be reverse-biased. This means a minimum of five checks must be made with a multimeter, for example, before a transistor can be considered good.
机译:一种检查npn晶体管是否有故障的常用方法包括测量其p-n结的电阻,即在基极和发射极之间以及基极和集电极之间。当结点正向偏置时(阳极正极,阴极负极),这些电阻值应低;而当反向偏置时(阳极负极,阴极正极),这些电阻值应高。此外,由于无论测试电压的极性如何,两个“背对背”结之一将始终被反向偏置,因此集电极和发射极之间的测量电阻应始终较高。这意味着,例如,在晶体管被认为良好之前,必须至少用万用表进行五次检查。

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