Using Degradation Data For Product Reliability Analysis

摘要

High reliability systems require individual components to have extremely high reliability for a long time. Often, the time for product development is short, imposing severe constraints on reliability testing. Traditionally, methods for the analysis of censored failure-time data are used to extrapolate mission reliability from the longest test times—even though there may be few observed failures.1 This significantly limits the accuracy and precision of the conclusions, motivating us to search for better methods.