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Reliability analysis equipment, reliability analysis methods and reliability analysis program

机译:可靠性分析设备,可靠性分析方法和可靠性分析程序

摘要

PROBLEM TO BE SOLVED: To provide a reliability analysis method supporting, during reliability analysis for a multipurpose design, the optimization of the multipurpose design by use of a plurality of design margins (reliability indexes) and each correlation degree between defective mode as indexes or the clarification of the causal relation/correlation hidden between the plurality of design margins or each correlation degree between defective modes and each design variable.;SOLUTION: This reliability analysis method comprises steps of calculating reliability indexes βi (i=1-m) for m defective modes corresponding to m specs (S103); calculating each correlation degree rij (i, j=1-m, ij) between defective modes by use of each overlapping degree of spec limit curved surface (S103); performing a design optimization using each correlation degree between reliability index and defective mode (S104); and analyzing the causal relation/correlation by means of a structural equation modeling using each correlation degree between reliability index and defective mode as a parameter (S105).;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:提供一种可靠性分析方法,该方法在用于多用途设计的可靠性分析过程中,通过使用多个设计裕量(可靠性指标)以及缺陷模式之间的每个相关程度作为指标来支持多用途设计的优化。澄清隐藏在多个设计裕量或缺陷模式与每个设计变量之间的每个相关程度之间的因果关系/相关性;解决方案:这种可靠性分析方法包括计算可靠性指标& Sub ij (i,j = 1-m,i> j)(S103);使用可靠性指标和缺陷模式之间的每个相关度进行设计优化(S104);并使用结构方程模型分析因果关系/相关性,并使用可靠性指标和缺陷模式之间的每个相关程度作为参数(S105)。;版权:(C)2005,JPO&NCIPI

著录项

  • 公开/公告号JP4028490B2

    专利类型

  • 公开/公告日2007-12-26

    原文格式PDF

  • 申请/专利权人 株式会社東芝;

    申请/专利号JP20040005988

  • 发明设计人 廣畑 賢治;

    申请日2004-01-13

  • 分类号G06F17/50;

  • 国家 JP

  • 入库时间 2022-08-21 20:17:04

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