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Cross-Coupled Repetitive Control of a Compliant Nanomanipulator for Micro-Stereolithography

机译:用于微立体刻录的柔顺纳米罐的交叉耦合重复控制

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摘要

This paper proposes an easy-implemented and high precision contouring control method for a self-developed compliant nanomanipulator supporting cost-effective micro-stereolithography (MSL). The proposed contouring control method is composed of a repetitive controller (RC) to achieve periodic trajectory tracking for each axis, and a cross-coupled control (CCC) for the coordination of contour errors. It is worth noting that the cross-coupled controller design and its integration to RC are not straightforward, as an incorrect feedback position may even deteriorate the contouring and an inappropriate design of the cross-coupled controller leads to instability of the system. For the proposed control structure, a correct feedback position is designed, hence a cross-coupled controller is constructed to ensure the stability and contour error reduction. Various simulations and real-time experiments are deployed on the nanomanipulator, and the comparative results validate the enhanced contour tracking performance of the proposed control method with the contour error 86 nm.
机译:本文提出了一种易于实施和高精度的轮廓控制方法,用于支持具有成本有效的微立体刻度(MSL)的自我开发的兼容纳米罐。所提出的轮廓控制方法由重复控制器(RC)组成,以实现每个轴的周期性轨迹跟踪,以及用于协调轮廓误差的交叉耦合控制(CCC)。值得注意的是,交叉耦合的控制器设计及其与RC的集成并不简单,因为不正确的反馈位置甚至可以恶化的轮廓和交叉耦合控制器的不适当设计导致系统的不稳定性。对于所提出的控制结构,设计了正确的反馈位置,因此构造交叉耦合控制器以确保减少稳定性和轮廓误差。在纳米操纵器上部署了各种模拟和实时实验,并且比较结果验证了具有轮廓误差86nm的提出控制方法的增强轮廓跟踪性能。

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