首页> 外文期刊>Quality and Reliability Engineering International >IN SITU FAILURE DETECTION IN THICK FILM MULTILAYER SYSTEMS
【24h】

IN SITU FAILURE DETECTION IN THICK FILM MULTILAYER SYSTEMS

机译:厚膜多层系统中的原位故障检测

获取原文
获取原文并翻译 | 示例
       

摘要

By means of in situ e.m.f.-measurements, leakage current measurements and impedance spectroscopy, it has been possible for the first time to detect spontaneous and forced blistering in thick film multilayers during formation at high temperatures. Also the occurrence of high temperature shorts in Ag-dielectric-Ag multilayers under DC-bias was detectable.
机译:借助原位电磁场测量,泄漏电流测量和阻抗谱,首次有可能在高温下检测厚膜多层膜中的自发和强制起泡。在直流偏压下,Ag-电介质-Ag多层中高温短路的发生也是可以检测到的。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号