Comparison of Weibull Small Samples using Monte Carlo Simulations

摘要

The evaluation of the functional reliability of different designs is a common task and times to failure can be compared using the likelihood ratio test. In the microelectronics industry, as in many others, the high cost of testing places severe restrictions on the sample size. Moreover, the products in these tests are often new and do not have previous reliability histories. These factors make the selection of the Type Ⅰ and Type Ⅱ errors in comparison tests very difficult. This paper presents the Monte Carlo simulation results of Type Ⅱ errors for the likelihood ratio test of comparison as a function of the Type Ⅰ error and the (small) sample size. Our conclusions are summarized as follows: (1) the common microelectronics industry standard sample size of 32 is often insufficient to reach satisfactory conclusions; (2) small sample tests should only be used for prescreening for significant differences; and (3) when only small samples are available, the Type Ⅰ and the Type Ⅱ errors must be selected carefully to prevent misleading conclusions.