Two-Stage Reliability Sampling Plans with Bogey Tests

摘要

This article considers the design of two-stage reliability test plans. In the first stage, a bogey test was performed, which will allow the user to demonstrate reliability at a high confidence level. If the lots pass the bogey test, the reliability sampling test is applied to the lots in the second stage. The purpose of the proposed sampling plan was to test the mean time to failure of the product as well as the minimum reliability at bogey. Under the assumption that the lifetime distribution follows Weibull distribution and the shape parameter is known, the two-stage reliability sampling plans with bogey tests are developed and the tables for users are constructed. An illustrative example is given, and the effects of errors in estimates of a Weibull shape parameter are investigated. A comparison of the proposed two-stage test with corresponding bogey and one-stage tests was also performed.