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Electrical characteristics of thin-base semiconductor diodes

机译:薄基半导体二极管的电气特性

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摘要

The influence of device parameters, circuit parameters (where applicable) and operating conditions on the current/voltage characteristics and switching behaviour of thin-base diodes (i.e. diodes for which the p-n junction and ohmic contact are separated by a thin uniform base layer) is examined. An expression is derived for the saturation current in terms of the base width and surface recombination velocity of the ohmic contact. The relationship between reverse current and voltage accounts for the non-saturation of reverse current resulting from the decrease in the effective base width with increase in voltage. Current and voltage measurements to test the validity of the theory are given. The rate of decay of minority-carrier storage charge when the diode is switched from forward to reverse conduction is treated theoretically, taking into account for the first time the finite surface recombination velocity of the ohmic contact. An expression is also obtained for the independent rate of discharge of the depletion layer. Finally, switching from reverse to forward conduction is discussed.
机译:器件参数,电路参数(如果适用)和工作条件对薄基极二极管(即pn结和欧姆接触被薄而均匀的基极层隔开的二极管)的电流/电压特性和开关性能​​的影响为检查。根据基极宽度和欧姆接触的表面复合速度,导出了饱和电流的表达式。反向电流与电压之间的关系说明了由于有效基极宽度随电压增加而减小而导致的反向电流不饱和。给出了电流和电压测量值以检验该理论的有效性。理论上处理了当二极管从正向切换到反向导通时少数载流子存储电荷的衰减率,这是首次考虑到欧姆接触的有限表面复合速度。还获得了关于耗尽层的独立放电速率的表达式。最后,讨论了从反向导通到正向导通的过程。

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