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IR DROP in High-Speed IC Packages and PCBs

机译:高速IC封装和PCB中的IR DROP

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Today's low-voltage, high-current designs require DC IR drop analysis for off-chip power distribution systems in order to optimize end-to-end voltage margins for every device on the distribution. This article will introduce the basics of IR drop analysis, exemplify the significance of IR drop associated with IC packages and PCBs, and demonstrate typical IR drop simulations for the identification of problematic power distributions. As system complexity and operational speeds increase, the power consumption of integrated circuits increases dramatically. Additionally, the IC supply voltage continues to drop with the inevitable scaling of VLSI technology. With the switch to 90 nm technologies from 130 nm technology, supply voltages have shrunk to 1.2 V and below. According to the International Technology Roadmap for Semiconductors, this trend is expected to continue. See FIGURE 1.
机译:当今的低电压,大电流设计要求对片外配电系统进行DC IR压降分析,以优化配电中每个设备的端到端电压裕量。本文将介绍IR压降分析的基础知识,举例说明与IC封装和PCB相关的IR压降的重要性,并演示用于识别有问题的功率分布的典型IR压降仿真。随着系统复杂性和操作速度的增加,集成电路的功耗急剧增加。此外,随着VLSI技术的必然发展,IC电源电压继续下降。随着从130 nm技术切换到90 nm技术,电源电压已缩小至1.2 V及以下。根据《国际半导体技术路线图》,这一趋势有望继续。参见图1。

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