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How Residues Form

机译:残留物如何形成

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The customer submitted several board assemblies that failed in the field and exhibited corrosion in close proximity to on-board components. The most common source of corrosion on electronics assemblies is residual flux. Fluxes can be highly reactive chemicals that, if left on the assemblies, can lead to corrosion, electrical degradation, and decreased reliability. In the presence of moisture and electrical bias, flux residue can enable dendritic growth as a result of electrochemical migration.rnTo establish the source of the corrosion, technical data sheets and materials safety data sheets (MSDS) can be used to help evaluate the chemistries of the approved fluxes. The cleaning process also is evaluated to ensure the efficacy of cleaning the fluxes. Further, by establishing a correlation between the composition of the residues and flux chemistries, one can eliminate or confirm the source of the corrosion. Analysis of the residues may be accomplished by employing scanning electron microscopy (SEM) with energy dispersive x-ray spectroscopy (EDS).
机译:客户提交了一些板组件,这些组件在现场失败了,并且在靠近板载组件的地方出现腐蚀。电子组件上最常见的腐蚀源是残留助焊剂。助焊剂可能是高反应性化学物质,如果留在组件上,会导致腐蚀,电降解和可靠性降低。在存在水分和电偏压的情况下,助焊剂残留物会由于电化学迁移而使树枝状晶体生长。rn为了确定腐蚀源,可使用技术数据表和材料安全数据表(MSDS)来帮助评估其化学性质批准的助焊剂。还评估了清洁过程,以确保清洁焊剂的功效。此外,通过在残留物的成分和助焊剂化学成分之间建立相关性,可以消除或确认腐蚀源。残留物的分析可以通过采用扫描电子显微镜(SEM)和能量色散X射线光谱仪(EDS)来完成。

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    《Printed Circuit Design》 |2010年第2期|5462|共2页
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