Direct determination of bulk etching rate for LR-115-II solid state nuclear track detectors

摘要

The thickness of the removed layer of the LR-115-II solid state nuclear track detector during etching is measured directly with a rather precise instrument. Dependence of bulk etching rate on temperature of the etching solution is investigated. It has been found that the bulk etching rate is 3.2 μm/h at 60℃ in 2.5 N NaOH of water solution. It is also found that the track density in detectors exposed to soil samples increases linearly with the removed layer.