X-ray Scattering for the Monitoring of Processes in Polymer Materials with Fiber Symmetry

摘要

Synchrotron facilities with improved equipment will grant the execution of very advanced scattering experiments to every interested polymer scientist. The patterns recorded are two-dimensional, high-resolution, and low-noise images. They permit to monitor structure evolution during the processing of polymer materials with repeat rates of several Hertz. In a different class of novel experiments the structure gradient inside of graded polymer materials will be determined with a spatial resolution of less than 1 μm. Scattering patterns must be complete. In order both to record complete patterns, and to evaluate them within tolerable time it appears reasonable to study parts with fiber symmetry. In the present paper a review of corresponding methodical work and the results of test experiments is presented that has recently been compiled in the group of the author.