首页> 外文期刊>Plasma Science, IEEE Transactions on >An ITER Challenge Absolute Surface Temperature Measurements of Low and Varying Emissivity Tungsten Plasma-Facing Components
【24h】

An ITER Challenge Absolute Surface Temperature Measurements of Low and Varying Emissivity Tungsten Plasma-Facing Components

机译:迭代挑战低和不同发射率钨等离子体组件的绝对表面温度测量

获取原文
获取原文并翻译 | 示例
           

摘要

One of the challenges that International Thermonuclear Experimental Reactor (ITER) will face during plasma operation is to determine the absolute divertor surface temperature of the actively water-cooled (70 °C, 3 MPa) tungsten plasma-facing units (PFUs) to ensure their integrity. The expected steady-state heat flux up to 10 MW/m2 is close to the operational limit and so one of the goals of the thermographic system is to make reliable measurements (wavelength band: 3.5– $4.5~mu ext{m}$ ) with relatively low error bars to avoid tungsten melting and material damages. The tungsten emissivity is low and dependent on wavelength, temperature, and surface state (roughness, cracks, oxidation, and erosion/deposition processes) which can evolve during the time along with plasma operation. An error on the absolute emissivity can lead to large absolute temperature errors, and consequently to either a reduction of the operational window to fulfill safety limits, or an increased risk regarding the integrity of the components. For the past years, a number of emissivity measurements have been performed with ITER-like PFU mock-ups made of different grades of tungsten, with different techniques, from different material makers, and from different manufacturers. The overall emissivity discrepancy is large, indicating that tungsten emissivity is a major issue for temperature measurement and wall protection. The accuracy of the temperature measurement is investigated for both monocolor and bicolor IR thermography techniques. We present laboratory tests performed with an IR camera equipped with a rotating filter wheel for bicolor temperature measurement. It shows that the bicolor technique can reach high precision $Delta ext {T}/ext {T} < 10{%}$ at high temperature assuming the emissivity ratio is constant regarding the two selected wavelengths.
机译:国际热核实验反应器(浸泡)在等离子体操作期间面临的挑战之一是确定主动水冷(70°C,3MPa)钨等离子体的绝对偏转器表面温度,以确保其正直。预期的稳态热通量高达10 mw / m 2 接近运营极限,因此热成像系统的目标之一是进行可靠的测量(波长带:3.5-<内联公式XMLNS:MML =“http://www.w3.org/1998/math/mathml”xmlns:xlink =“http://www.w3.org/1999/xlink”> $ 4.5〜 mu text {m} $ )具有相对较低的误差条以避免钨熔化和材料损坏。钨发射率低且取决于波长,温度和表面状态(粗糙度,裂缝,氧化和腐蚀/沉积/沉积过程),其可以在时间和等离子体操作期间演化。绝对发射率的误差可能导致绝对温度误差大,并因此导致操作窗口的减少以满足安全限制,或者有关于组件完整性的增加的风险。在过去几年中,已经使用了由不同等级的钨,具有不同的技术,来自不同材料制造商以及不同制造商的不同技术的迭代率的PFU模型进行了许多发射率测量。整体发射率差异很大,表明钨发射率是温度测量和墙壁保护的主要问题。针对单彩色和双色IR热成像技术研究了温度测量的准确性。我们呈现使用配备有旋转过滤轮的IR摄像机进行实验室测试,用于双色温度测量。它表明双色技术可以达到高精度<内联公式XMLNS:MML =“http://www.w3.org/1998/math/mathml”xmlns:xlink =“http://www.w3.org/1999/xlink”> $ delta text {t} / text {t} <10 {%} $ 在假设发射率比对于两个选定的波长是恒定的,在高温下。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号