XPS Investigation of Plasma-Deposited Polysiloxane Films Irradiated with Helium Ions

摘要

This work describes an XPS investigation of plasma-deposited polysiloxane films irradiated with 170 keV He~+ ions at fluences, Φ, ranging from 1 x 10~(14) to 1 x 10~(16) cm~(-2). Modifications in the atomic concentrations of the surface atoms with Φ were revealed by changes in the [O]/ [Si], [O]/[C] and [C]/[Si] atomic ratios. Surface chemical structure modifications were evidenced by the increasing C1s peak width and asymmetry as Φ was increased, due to the formation of ether and carboxyl functionalities. Moreover, structural transformations were indicated by the positive binding energy shift of the Si2p peaks, due to the increasing Si oxidation. Correlations of the XPS data with other results from previous work on polysiloxanes illustrate the role of ion beam-induced bond breaking on the structural modifications.