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Electronic, vibrational, elastic, and piezoelectric properties of monolayer Janus MoSTe phases: A first-principles study

机译:单层Janus MOTEE阶段的电子,振动,弹性和压电性能:一项研究

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摘要

By performing density functional theory based first-principles calculations, the electronic, vibrational, elastic, and piezoelectric properties of two dynamically stable crystal phases of monolayer Janus MoSTe, namely 1H-MoSTe and 1T'-MoSTe, are investigated. Vibrational frequency analysis reveals that the other possible crystal structure, 1T-MoSTe, of this Janus monolayer does not exhibit dynamical stability. The 1H-MoSTe phase is found to be an indirect band-gap semiconductor while 1T'-MoSTe is predicted as small-gap semiconductor. Notably, in contrast to the direct band-gap nature of monolayers 1H-MoS2 and 1H-MoTe2, 1H-MoSTe is found to be an indirect gap semiconductor driven by the induced surface strains on each side of the structure. The calculated Raman spectrum of each structure shows unique character enabling us to clearly distinguish the stable crystal phases via Raman measurements. The systematic piezoelectric stress and strain coefficient analysis reveals that out-of-plane piezoelectricity appears in 1H-MoSTe and the noncentral symmetric 1T'-MoSTe has large piezoelectric coefficients. Static total-energy calculations show clearly that the formation of 1T'-MoSTe is feasible by using 1T'-MoTe2 as a basis monolayer. Therefore, we propose that the Janus MoSTe structure can be fabricated in two dynamically stable phases which possess unique electronic, dynamical, and piezoelectric properties.
机译:通过执行基于密度的主要原理计算,对单层Janus MOTEE的两个动态稳定的结晶阶段的电子,振动,弹性和压电性能,即1H-MOTEE和1T-MOTEE。振动频率分析表明,其他可能的晶体结构,1T-monte,这是Janus单层的稳定性稳定性。发现1H-MOTEE阶段是间接带间隙半导体,而1T'-MOTEE被预测为小间隙半导体。值得注意的是,与单层1H-MOS2和1H-MOTE2的直接带间隙性质相反,发现1H-MOTEE是由结构的每一侧的诱导表面菌株驱动的间接间隙半导体。每个结构的计算的拉曼光谱显示了独特的字符,使我们能够通过拉曼测量清楚地区分稳定的晶相。系统压电应力和应变系数分析显示,在1H-MOTE中出现平面外压电性,并且非中心对称1T-MOTEE具有大的压电系数。静电总能量计算明显显示,通过使用1T'-Mote2作为基础单层的形成是可行的。因此,我们提出了Janus MOTEE结构可以在两个动态稳定的阶段中制造,具有独特的电子,动态和压电性能。

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  • 来源
    《Physical review》 |2019年第4期|045415.1-045415.8|共8页
  • 作者单位

    Univ Antwerp Dept Phys Groenenborgerlaan 171 B-2020 Antwerp Belgium;

    Eskisehir Tech Univ Fac Engn Dept Mech Engn TR-26555 Eskisehir Turkey;

    Univ Antwerp Dept Phys Groenenborgerlaan 171 B-2020 Antwerp Belgium;

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