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首页> 外文期刊>Physical review. B, Condensed Matter And Materals Physics >Photoinduced structural instability in a hydrogenated amorphous silicon-germanium alloy with high structural inhomogeneity
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Photoinduced structural instability in a hydrogenated amorphous silicon-germanium alloy with high structural inhomogeneity

机译:具有高结构不均匀性的氢化非晶硅锗合金中的光诱导结构不稳定性

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We studied photoinduced structural instability around the Si-H bond in hydrogenated amorphous silicon-germanium alloy (a-SiGe:H) using modulated-infrared (IR) absorption, which is a real-time change in the absorption strength of the Si-H stretching vibration following a modulated band-gap excitation. We found in the modulated IR-absorption spectrum, that a band expected around 2000 cm~(-1), based on the absorption-coefficient spectrum of the Si-H stretching vibration, is missing. An intense modulated IR-absorption band is present at about 2000 cm~(-1) in the spectra of materials such as undoped a-Si:H and its alloys with N or O, which are characterized by a continuously connected, disordered network with a built-in local strain. Thus, the absence of the 2000-cm~(-1) spectral component is interpreted as a sign of the absence of structural instability in the vicinity of the isolated Si-H bond in a-SiGe:H that has a fragmented network structure. The modulated IR-absorption band that is still observed in a-SiGe:H is found to be closely related with the 2030-cm~(-1) constituent component of the IR-absorption band of the Si-H stretching mode in this alloy. Studies on the 2030-cm~(-1) component present in the IR-absorption band of the Si-H stretching mode in polymorph- and microcrystalline-Si make us infer that structural instability in a-SiGe:H takes place in the vicinity of the H-induced platelets.
机译:我们使用调制红外(IR)吸收研究了氢化非晶硅锗合金(a-SiGe:H)中Si-H键周围的光诱导结构不稳定性,这是Si-H吸收强度的实时变化在调制的带隙激励之后扩展振动。我们在调制的红外吸收光谱中发现,基于Si-H拉伸振动的吸收系数谱,预期的2000 cm〜(-1)附近的谱带丢失了。在未掺杂的a-Si:H及其与N或O的合金等材料的光谱中,约2000 cm〜(-1)处存在强烈的调制IR吸收带,其特征是连续连接的无序网络与内置的本地应变。因此,不存在2000-cm〜(-1)的光谱分量被解释为在具有碎片网络结构的a-SiGe:H中,在孤立的Si-H键附近不存在结构不稳定性的迹象。发现该合金中仍在a-SiGe:H中观察到的调制IR吸收带与Si-H拉伸模式的IR吸收带的2030-cm〜(-1)组成成分密切相关。对多晶型硅和微晶硅中Si-H拉伸模式的红外吸收带中存在的2030-cm〜(-1)组分的研究使我们推断a-SiGe:H的结构不稳定性发生在附近H诱导的血小板。

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