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Characterization of hydroxyl groups on water-reacted Si(001)-2×1 using synchrotron radiation O 1s core-level spectroscopies and core-excited state density-functional calculations

机译:利用同步辐射O 1s核能级谱学和核激发态密度泛函计算表征水反应Si(001)-2×1上的羟基

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摘要

The system constituted by the Si(001)-2 × 1 surface exposed to water molecules at room temperature has been chosen to single out the electron structure of the hydroxyl SiOH, a surface species playing an important role in many technologically relevant processes. We confront here original core-electron spectroscopy density functional theory (DFT) calculations to synchrotron radiation O 1s x-ray photoelectron spectroscopy (XPS) and (polarization-dependent) near-edge x-ray absorption spectroscopy (NEXAFS) data. Using clusters to mimic the silicon surface, various SiOH environments (unpaired and paired hydroxyls) have been examined. The impact of the hydrogen bond on the calculated core-ionized and/or neutral core-excited states is examined, and compared to the limit case of the water dimer. The theoretical approach enables us to label the main experimental NEXAFS transitions and to interpret their polarization-dependent dichroism. As water dissociation on the surface can go beyond the formation of hydroxyls, the DFT electron structure of bridging oxygens (SiOSi) is calculated. It is predicted that the XPS line associated to the latter species is shifted by 0.5-1.0 eV to lower binding energy with respect to that of the hydroxyls. Then, on this basis, the reconstruction of the experimental O 1s XPS spectrum can provide the relative distribution of hydroxyls and of the bridging oxygens (a minority species). The present work paves the way for future spectroscopic works examining the bonding and reactiveness of hydroxyls with other molecular species.
机译:选择了由在室温下暴露于水分子的Si(001)-2×1表面构成的系统,以挑选出羟基SiOH的电子结构,该表面物质在许多与技术相关的过程中均起着重要作用。我们在这里面对原始的核电子能谱密度泛函理论(DFT)计算,以同步辐射O 1s X射线光电子能谱(XPS)和(偏振相关的)近边缘X射线吸收能谱(NEXAFS)数据。使用簇模拟硅表面,已经研究了各种SiOH环境(未成对和成对的羟基)。检查了氢键对计算出的核离子化和/或中性核激发态的影响,并将其与水二聚体的极限情况进行了比较。理论方法使我们能够标记主要的实验NEXAFS跃迁并解释其偏振相关的二向色性。由于表面上的水离解可以超出羟基的形成,因此可以计算出桥接氧(SiOSi)的DFT电子结构。据预测,与后一种物质相关的XPS谱线移动了0.5-1.0 eV,从而相对于羟基具有更低的结合能。然后,在此基础上,实验O 1s XPS光谱的重建可以提供羟基和桥联氧(少数物种)的相对分布。本工作为将来检查羟基与其他分子种类的键合和反应性的光谱学工作铺平了道路。

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