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首页> 外文期刊>Physical review >Electronic structure of the delafossite-type CuMO_2 (M = Sc, Cr, Mn, Fe, and Co): Optical absorption measurements and first-principles calculations
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Electronic structure of the delafossite-type CuMO_2 (M = Sc, Cr, Mn, Fe, and Co): Optical absorption measurements and first-principles calculations

机译:铜铁矿型CuMO_2(M = Sc,Cr,Mn,Fe和Co)的电子结构:光吸收测量和第一性原理计算

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摘要

We compared the results of first-principles calculations with measured absorption spectra in thin films of delafossite-type CuMO_2 (M = Sc, Cr, Mn, Fe, and Co) taken at 10 K. Two optical transitions were found: one is associated with Cu3rf + O2p→ Cu3d_z~2 + 4s observed in all of the CuMO_2 films, and the other is associated with Cu3d + O2p → M3d detected for M = Mn, Fe, and Co. The energy of the former transition showed an unexpected dependence on the atomic number of M. An abrupt change of this energy occurs for M = Cr, which is explained as a result of the interaction between the Cu3d_Z~2 + 4s and M3d bands.
机译:我们将第一性原理计算的结果与在10 K下拍摄的铜铁矿型CuMO_2(M = Sc,Cr,Mn,Fe和Co)薄膜中的吸收光谱进行了测量。发现了两个光学跃迁:一个与在所有CuMO_2薄膜中均观察到Cu3rf + O2p→Cu3d_z〜2 + 4s,另一个与检测到的M = Mn,Fe和Co的Cu3d + O2p→M3d有关。前一个跃迁的能量显示出对当M = Cr时,此能量发生突然变化,这是由于Cu3d_Z〜2 + 4s与M3d谱带之间的相互作用而导致的。

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  • 来源
    《Physical review》 |2011年第4期|p.041411.1-041411.4|共4页
  • 作者单位

    WPI Advanced Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan;

    Correlated Electron Research Group (CERG), RIKEN Advanced Science Institute (ASI), Wako 351 -0198, Japan;

    Department of Chemistry, University of Tokyo, Tokyo 113-0033, Japan,PRESTO, Japan Science and Technology Agency, Saitama 332-0012, Japan;

    Research Center for Integrated Science, Japan Advanced Institute of Science and Technology, Ishikawa 923-1292, Japan,Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;

    WPI Advanced Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan,Correlated Electron Research Group (CERG), RIKEN Advanced Science Institute (ASI), Wako 351 -0198, Japan,Quantum Phase Electronics Center and Department of Applied Physics, University of Tokyo, Tokyo 113-8656, Japan,CREST, Japan Science and Technology Agency, Tokyo 102-0075, Japan;

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  • 正文语种 eng
  • 中图分类
  • 关键词

    thin film structure and morphology; excitons and related phenomena; optical properties of bulk materials and thin films;

    机译:薄膜的结构和形态;激子和相关现象;散装材料和薄膜的光学特性;

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