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首页> 外文期刊>Physical review >Direct correlation of crystal structure and optical properties in wurtzite/zinc-blende GaAs nanowire heterostructures
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Direct correlation of crystal structure and optical properties in wurtzite/zinc-blende GaAs nanowire heterostructures

机译:纤锌矿/闪锌矿型砷化镓纳米线异质结构的晶体结构与光学性质直接相关

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摘要

A method for the direct correlation at the nanoscale of structural and optical properties of single GaAs nanowires is reported. Nanowires consisting of 100% wurtzite and nanowires presenting zinc-blende/wurtzite polytypism are investigated by photoluminescence spectroscopy and transmission electron microscopy. The photoluminescence of wurtzite GaAs is consistent with a band gap of 1.5 eV. In the polytypic nanowires, it is shown that the regions that are predominantly composed of either zinc-blende or wurtzite phase show photoluminescence emission close to the bulk GaAs band gap, while regions composed of a nonperiodic superlattice of wurtzite and zinc-blende phases exhibit a redshift of the photoluminescence spectra as low as 1.455 eV. The dimensions of the quantum heterostructures are correlated with the light emission, allowing us to determine the band alignment between these two crystalline phases. Our first-principles electronic structure calculations within density functional theory, employing a hybrid-exchange functional, predict band offsets and effective masses in good agreement with experimental results.
机译:报道了一种在纳米尺度上直接关联单个GaAs纳米线的结构和光学特性的方法。通过光致发光光谱法和透射电子显微镜研究了由100%纤锌矿组成的纳米线和呈现出闪锌矿/纤锌矿多型性的纳米线。纤锌矿GaAs的光致发光与1.5 eV的带隙一致。在多型纳米线中,显示出主要由闪锌矿或纤锌矿相组成的区域显示出接近整体GaAs带隙的光致发光发射,而由纤锌矿和闪锌矿相的非周期性超晶格组成的区域显示出低至1.455 eV的光致发光光谱的红移。量子异质结构的尺寸与发光相关,从而使我们能够确定这两个结晶相之间的能带排列。我们在密度泛函理论内的第一性原理电子结构计算,采用混合交换函数,预测能带偏移和有效质量,与实验结果吻合良好。

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  • 来源
    《Physical review》 |2011年第4期|p.045303.1-045303.10|共10页
  • 作者单位

    Walter Schottky Institut and Physik Department, Technische Universitaet Muenchen, Am Coulombwall 3, D-85748 Garching, Germany,Laboratoire des Materiaux Semiconducteurs, Institut des Materiaux, Ecole Polytechnique Federate de Lausanne, Lausanne, Switzerland;

    Laboratoire des Materiaux Semiconducteurs, Institut des Materiaux, Ecole Polytechnique Federate de Lausanne, Lausanne, Switzerland,Departament d'Electronica,Universitat de Barcelona, E-08028 Barcelona, Catalonia, Spain;

    Laboratory for Multiscale Modeling of Materials, Institut des Materiaux, Ecole Polytechnique Federate de Lausanne, Lausanne, Switzerland;

    Laboratory for Multiscale Modeling of Materials, Institut des Materiaux, Ecole Polytechnique Federate de Lausanne, Lausanne, Switzerland;

    Department of Atomic Physics, Budapest University of Technology and Economics, Budafoki lit 8., H-l 111, Budapest, Hungary;

    Institute for Experimental and Applied Physics, University of Regensburg, Universitaetsstrasse 31, D-93053 Regensburg, Germany;

    Walter Schottky Institut and Physik Department, Technische Universitaet Muenchen, Am Coulombwall 3, D-85748 Garching, Germany,Laboratoire des Materiaux Semiconducteurs, Institut des Materiaux, Ecole Polytechnique Federate de Lausanne, Lausanne, Switzerland;

    Departament d'Electronica,Universitat de Barcelona, E-08028 Barcelona, Catalonia, Spain;

    Walter Schottky Institut and Physik Department, Technische Universitaet Muenchen, Am Coulombwall 3, D-85748 Garching, Germany,;

    Institute for Experimental and Applied Physics, University of Regensburg, Universitaetsstrasse 31, D-93053 Regensburg, Germany;

    Institute for Experimental and Applied Physics, University of Regensburg, Universitaetsstrasse 31, D-93053 Regensburg, Germany;

    Laboratory for Multiscale Modeling of Materials, Institut des Materiaux, Ecole Polytechnique Federate de Lausanne, Lausanne, Switzerland;

    Instituci6 Catalana de Recerca I Estudis Avangats (ICREA) and Institut de Ciencia de Materials de Barcelona, Consejo Superior de Investigaciones Cientfficas (CSIC), E-08I93 Bellaterra, Catalonia, Spain;

    Walter Schottky Institut and Physik Department, Technische Universitaet Muenchen, Am Coulombwall 3, D-85748 Garching, Germany,Laboratoire des Materiaux Semiconducteurs, Institut des Materiaux, Ecole Polytechnique Federate de Lausanne, Lausanne, Switzerland;

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  • 正文语种 eng
  • 中图分类
  • 关键词

    Ⅲ-Ⅴ semiconductors; grain and twin boundaries;

    机译:Ⅲ-Ⅴ族半导体;晶界和孪晶界;

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