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Mechanism for the large conductance modulation in electrolyte-gated thin gold films

机译:电解质门控金薄膜中大电导调制的机理

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摘要

Electrolyte gating using ionic liquid electrolytes has recently generated considerable interest as a method to achieve large carrier density modulations in a variety of materials. In noble metal thin films, electrolyte gating results in large changes in sheet resistance. The widely accepted mechanism for these changes is the formation of an electric double layer with a charged layer of ions in the liquid and accumulation or depletion of carriers in the thin film. We report here a different mechanism. In particular, we show using x-ray absorption near edge structure (XANES) that the previously reported large conductance modulation in gold films is due to reversible oxidation and reduction of the surface rather than the charging of an electric double layer. We show that the double layer capacitance accounts for less than 10% of the observed change in transport properties. These results represent a significant step towards understanding the mechanisms involved in electrolyte gating.
机译:最近,使用离子液体电解质进行电解质浇注引起了人们的极大兴趣,作为一种在多种材料中实现大载流子密度调节的方法。在贵金属薄膜中,电解质门控会导致薄层电阻的较大变化。这些改变的广泛接受的机制是在液体中形成带电荷的离子层的电双层,并在薄膜中积累或耗尽载流子。我们在这里报告了一种不同的机制。特别地,我们显示了使用x射线近边缘结构(XANES)吸收,先前报道的金膜中的大电导调制是由于可逆的氧化和表面还原而不是双电层的充电。我们显示双层电容占不到所观察到的传输特性变化的10%。这些结果代表了了解电解质门控机制的重要一步。

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