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首页> 外文期刊>Physical review >First-principles theory of field-effect doping in transition-metal dichalcogenides: Structural properties, electronic structure, Hall coefficient, and electrical conductivity
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First-principles theory of field-effect doping in transition-metal dichalcogenides: Structural properties, electronic structure, Hall coefficient, and electrical conductivity

机译:过渡金属二卤化物中场效应掺杂的第一性原理:结构性质,电子结构,霍尔系数和电导率

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We investigate how field-effect doping affects the structural properties, the electronic structure, and the Hall coefficient of few-layers transition-metal dichalcogenides by using density-functional theory. We consider monolayers, bilayers, and trilayers of the H polytype of MoS_2, MoSe_2, MoTe_2, WS2, and WSe_2 and provide a full database of electronic structures and Hall coefficients for hole and electron doping. We find that, for both electron and hole doping, the electronic structure depends on the number of layers and cannot be described by a rigid band shift. Furthermore, it is important to relax the structure under the asymmetric electric field. Interestingly, while the width of the conducting channel depends on the doping, the number of occupied bands at each given k point is almost uncorrelated with the thickness of the doping-charge distribution. Finally, we calculate within the constant-relaxation-time approximation the electrical conductivity and the inverse Hall coefficient. We demonstrate that in some cases the charge determined by Hall-effect measurements can deviate from the real charge by up to 50%. For hole-doped MoTe_2 the Hall charge has even the wrong polarity at low temperature. We provide the mapping between the doping charge and the Hall coefficient. We present more than 250 band structures for all doping levels of the transition-metal dichalcogenides considered within this work.
机译:我们使用密度泛函理论研究了场效应掺杂如何影响结构性能,电子结构和几层过渡金属二卤化氢的霍尔系数。我们考虑了MoS_2,MoSe_2,MoTe_2,WS2和WSe_2的H多态性的单层,双层和三层,并提供了完整的电子结构数据库以及空穴和电子掺杂的霍尔系数。我们发现,对于电子和空穴掺杂,电子结构都取决于层数,并且不能用刚性能带位移来描述。此外,重要的是在非对称电场下放松结构。有趣的是,尽管导电沟道的宽度取决于掺杂,但是在每个给定的k点所占据的能带数几乎与掺杂电荷分布的厚度无关。最后,我们在恒定松弛时间的近似值内计算电导率和霍尔系数的倒数。我们证明,在某些情况下,由霍尔效应测量确定的电荷可能会与实际电荷偏离最多50%。对于掺杂空穴的MoTe_2,霍尔电荷在低温下甚至具有错误的极性。我们提供了掺杂电荷和霍尔系数之间的映射。我们为这项工作中考虑的所有过渡金属二卤化钨掺杂水平提供了250多个能带结构。

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