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机译:块状绝缘Sn掺杂Bi_(1.1)Sb_(0.9)Te_2S单晶中拓扑表面态电导的测量
Department of Physics and Astronomy, The Johns Hopkins University, Baltimore, Maryland 21218, USA;
Department of Physics and Astronomy, The Johns Hopkins University, Baltimore, Maryland 21218, USA,Department of Physics, University of California, Berkeley, California 94720, USA;
Department of Chemistry, Princeton University, Princeton, New Jersey 08544, USA;
Department of Chemistry, Princeton University, Princeton, New Jersey 08544, USA;
Department of Physics and Astronomy, The Johns Hopkins University, Baltimore, Maryland 21218, USA;
机译:APS -APS 2017年3月会议-活动-块绝缘Sn掺杂Bi $ _ {1.1} $ Sb $ _ {0.9} $ Te $ _2 $ S单晶的拓扑表面态光导的测量
机译:块状绝缘Sn掺杂Bi1.1Sb0.9Te2S单晶的拓扑表面态电导的测量
机译:Van Hove奇异性是由拓扑绝缘子Sn掺杂Bi_(1.1)Sb_(0.9)Te_2S中的墨西哥帽形反向带引起的
机译:Bi_(1.46)SB_(0.54)TE_(1.7)SE_(1.3)拓扑绝缘体单晶的磁传输研究
机译:光学单晶的近表面机械性能和对确定性微研磨的表面响应。
机译:具有优良性能的掺锡Bi1.1Sb0.9Te2S块状晶体绝缘子
机译:测量拓扑表面态光导 体积绝缘sn掺杂Bi $ _ {1.1} $ sb $ _ {0.9} $ Te $ _2 $ s单晶