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首页> 外文期刊>Physical review >Van Hove singularity arising from Mexican-hat-shaped inverted bands in the topological insulator Sn-doped Bi_(1.1)Sb_(0.9)Te_2S
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Van Hove singularity arising from Mexican-hat-shaped inverted bands in the topological insulator Sn-doped Bi_(1.1)Sb_(0.9)Te_2S

机译:Van Hove奇异性是由拓扑绝缘子Sn掺杂Bi_(1.1)Sb_(0.9)Te_2S中的墨西哥帽形反向带引起的

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摘要

The optical properties of Sn-doped Bi_(1.1)Sb_(0.9)Te_2S, the most bulk-insulating topological insulator thus far, have been examined at different temperatures over a broad frequency range. No Drude response is detected in the low-frequency range down to 30 cm~(-1), corroborating the excellent bulk-insulating property of this material. Intriguingly, we observe a sharp peak at about 2200 cm~(-1) in the optical conductivity at 5 K. Further quantitative analyses of the line shape and temperature dependence of this sharp peak, in combination with first-principles calculations, suggest that it corresponds to a van Hove singularity arising from Mexican-hat-shaped inverted bands. Such a van Hove singularity is a pivotal ingredient of various strongly correlated phases.
机译:迄今为止,Sn掺杂的Bi_(1.1)Sb_(0.9)Te_2S是迄今最具体积绝缘的拓扑绝缘体,其光学特性已在较宽的频率范围内的不同温度下进行了测试。在低至30 cm〜(-1)的低频范围内均未检测到Drude响应,从而证实了该材料的优异绝热性能。有趣的是,我们在5 K处的光导率中在2200 cm〜(-1)处观察到一个尖峰。结合第一原理计算,对该尖峰的线形和温度依赖性进行了进一步的定量分析,表明它对应于由墨西哥帽形倒置带引起的van Hove奇点。这种van Hove奇异性是各种强相关相位的关键组成部分。

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