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Confinement effects in ultrathin ZnO polymorph films: Electronic and optical properties

机译:超薄ZnO多晶型薄膜的限制效应:电子和光学性质

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摘要

Relying on generalized-gradient and hybrid first-principles simulations, this work provides a complete characterization of the electronic properties of ZnO ultrathin films, cut along the body-centered-tetragonal(010), cubane(100), hexagonal boron nitride(0001), zinc-blende(110), and wurtzite (1010) and (0001) orientations. The characteristics of the local densities of states are analyzed in terms of the reduction of the Madelung potential on undercoordinated atoms and surface states/resonances appearing at the top of the valence band and bottom of the conduction band. The gap width in the films is found to be larger than in the corresponding bulks, which is assigned to quantum confinement effects. The components of the high-frequency dielectric constant are determined and the absorption spectra of the films are computed. They display specific features just above the absorption threshold due to transitions from or to the surface resonances. This study provides a first understanding of finite-size effects on the electronic properties of ZnO thin films and a benchmark which is expected to foster experimental characterization of ultrathin films via spectroscopic techniques.
机译:依靠广义梯度和混合第一性原理模拟,这项工作提供了ZnO超薄膜的电子特性的完整表征,这些超氧化物薄膜沿着体心四边形(010),古巴(100),六方氮化硼(0001)切割,闪锌矿(110)和纤锌矿(1010)和(0001)方向。根据在配位不足的原子上的马德隆电势的降低以及出现在价带顶部和导带底部的表面态/共振,分析了马德隆势的局部密度特征。发现膜中的间隙宽度大于相应的块中的间隙宽度,这被分配给量子限制效应。确定高频介电常数的成分,并计算薄膜的吸收光谱。由于表面共振或表面共振的转变,它们显示出刚好高于吸收阈值的特定特征。这项研究提供了对ZnO薄膜的电子特性的有限尺寸效应的初步了解,并有望成为一个基准,有望通过光谱技术促进超薄膜的实验表征。

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  • 来源
    《Physical review》 |2016年第19期|195435.1-195435.9|共9页
  • 作者单位

    CNRS, UMR 7588, Institut des Nanosciences de Paris, F-75005 Paris, France Universite Pierre et Marie Curie (Universite Paris Ⅵ), Paris, France,King's College of London, London, United Kingdom;

    CNRS, UMR 7588, Institut des Nanosciences de Paris, F-75005 Paris, France Universite Pierre et Marie Curie (Universite Paris Ⅵ), Paris, France;

    CNRS, UMR 7588, Institut des Nanosciences de Paris, F-75005 Paris, France Universite Pierre et Marie Curie (Universite Paris Ⅵ), Paris, France;

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