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首页> 外文期刊>Physical review >Weak antilocalization induced by Rashba spin-orbit interaction in layered III-VI compound semiconductor GaSe thin films
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Weak antilocalization induced by Rashba spin-orbit interaction in layered III-VI compound semiconductor GaSe thin films

机译:层状III-VI化合物半导体GaSe薄膜中Rashba自旋轨道相互作用引起的弱反定位

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摘要

Magnetoconductance (MC) at low temperature was measured to investigate spin-related transport affected by spin-orbit interaction (SOI) in III-VI compound n-type GaSe thin films. Results reveal that MC shows weak antilocalization (WAL). Its temperature and gate voltage dependences reveal that the dominant spin relaxation is governed by the D'yakonov-Perel' mechanism associated with the Rashba SOI. The estimated Rashba SOI strength in GaSe is much stronger than that of III-V compound GaAs quantum wells, although the energy gap and spin split-off band in GaSe closely resemble those in GaAs. The angle dependence of WAL amplitude in the in-plane magnetic field direction is almost isotropic. This isotropy indicates that the strength of the Dresselhaus SOI is negligible compared with the Rashba SOI strength. The SOI effect in n-GaSe thin films differs greatly from those of III-V compound semiconductors and transition-metal dichalcogenides.
机译:测量了低温下的磁导率(MC),以研究III-VI化合物n型GaSe薄膜中受自旋轨道相互作用(SOI)影响的自旋相关输运。结果显示MC显示弱的抗本地化(WAL)。其对温度和栅极电压的依赖性表明,主要的自旋弛豫受与Rashba SOI相关的D'yakonov-Perel'机制控制。尽管GaSe中的能隙和自旋分裂带与GaAs中的能带隙和自旋分裂带非常相似,但GaSe中的Rashba SOI强度估计值比III-V族化合物GaAs量子阱要强得多。 WAL振幅在面内磁场方向上的角度依赖性几乎是各向同性的。该各向同性表明,与Rashba SOI强度相比,Dresselhaus SOI的强度可以忽略不计。 n-GaSe薄膜中的SOI效应与III-V化合物半导体和过渡金属二卤化物的SOI效应有很大差异。

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  • 来源
    《Physical review》 |2017年第16期|161303.1-161303.6|共6页
  • 作者单位

    Department of Materials Science, Tohoku University, Sendai 980-8579, Japan;

    Department of Materials Science, Tohoku University, Sendai 980-8579, Japan,Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan;

    Nanophoton R&D Center, Nanophoton Corporation, Osaka 565-0871, Japan;

    Department of Materials Science, Tohoku University, Sendai 980-8579, Japan,Center for Spintronics Research Network, Tohoku University, Sendai 980-8579, Japan;

    Department of Materials Science, Tohoku University, Sendai 980-8579, Japan;

    Department of Materials Science, Tohoku University, Sendai 980-8579, Japan,Center for Spintronics Research Network, Tohoku University, Sendai 980-8579, Japan;

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