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首页> 外文期刊>Physica status solidi >GaN-based Schottky barrier ultraviolet photodetector with a 5-pair AlGaN-GaN intermediate layer
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GaN-based Schottky barrier ultraviolet photodetector with a 5-pair AlGaN-GaN intermediate layer

机译:具有5对AlGaN-GaN中间层的GaN基肖特基势垒紫外光电探测器

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摘要

A GaN-based Schottky barrier diode (SBD) with a 5-pair AlGaN-GaN intermediate layer for ultraviolet (UV) photo-detector (PD) was fabricated and investigated. It was found that we could achieve a smaller dark leakage current and noise level by using the 5-pair AIGaN-GaN intermediate layer. For our device biased at -5 V, the responsivity at 360 nm was found to be 0.26 AAV and the UV-to-visible rejection ratio was estimated to be 1.83 × 10~4. At the same bias, it was found that minimum noise equivalent power and normalized detectivity of our device were 1.00 × 10~(-9) W and 1.45 × 10~9 cmHz~(0.5)W~(-1), respectively. This indicates a simple and effective way to fabricate high-performance PDs for UV detection.
机译:制作并研究了具有5对AlGaN-GaN中间层的基于GaN的肖特基势垒二极管(SBD),该中间层用于紫外(UV)光电探测器(PD)。发现通过使用5对AIGaN-GaN中间层,可以实现较小的暗漏电流和噪声水平。对于在-5 V偏压下的器件,发现在360 nm处的响应率为0.26 AAV,并且紫外可见阻光比估计为1.83×10〜4。在相同的偏置下,我们的设备的最小噪声等效功率和归一化检测率分别为1.00×10〜(-9)W和1.45×10〜9 cmHz〜(0.5)W〜(-1)。这表明制造用于紫外线检测的高性能PD的简单有效方法。

著录项

  • 来源
    《Physica status solidi》 |2012年第3期|p.579-584|共6页
  • 作者单位

    National Synchrotron Radiation Research Center, Hsin-Ann Rd. 101, 30076 Hsinchu, Taiwan;

    Department of Electro-Optical Engineering, Kun Shan University, Dawan Rd. 949, 71003 Tainan City, Taiwan;

    Institute of Microelectronics, Department of Electrical Engineering, National Cheng Kung University, University Rd. 1,70101 Tainan City, Taiwan;

    Department of Electronic Engineering, Cheng Shiu University, Cheng-Ching Rd. 840, 83347 Kaohsiung City, Taiwan;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    GaN; intermediate layers; ultraviolet photodetectors;

    机译:氮化镓;中间层;紫外线光电探测器;

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