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Improved thermal stability of antimony-doped amorphous selenium film for X-ray flat-panel detectors

机译:用于X射线平板探测器的掺锑非晶硒膜的改进的热稳定性

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摘要

Amorphous selenium (a-Se) film is ,a promising photoconduc-tic material for X-ray flat-panel detectors (FPD) application. However. a-Se tends to be crystalline So at near room temperature. This remarkable temperature sensitivity limits its practical application. To prevent the near-room-temperature crystallization of a-Se film, we fabricate antimony (Sb)-doped a-Se films using a vacuum ev aporation technique equipped with an in situ cooling trap. We experimentally demonstrate that the Sb doping improves the thermal stahility of a-Se film while possessing a similar X-ray photoelectric conversion efficiency as the pure a-Se film. After air annealing at 50℃ for 90 rnin, the X-ray diffraction (XRD) results of the 4.1 at.% Sb-doped a-Sc film shows no detectable crystallization diffraction peak. Upon applying an electric field of 10Vμm~(-1) , such Sb-doped a-Se film exhibits dark current density below 1 nA cm~(-2). while under an X-ray dosage of about 4mGy. the annealed Sb-doped a Se film shows a photocurrent density of more than l00nA cm~(-2)
机译:非晶硒(a-Se)膜是一种有希望的X射线平板探测器(FPD)应用的光导材料。然而。 a-Se在室温附近趋于结晶。这种非凡的温度敏感性限制了其实际应用。为了防止a-Se膜在室温附近结晶,我们使用配备有原位冷却阱的真空蒸发技术制备了掺锑(Sb)的a-Se膜。我们通过实验证明,Sb掺杂可提高a-Se膜的热稳定性,同时具有与纯a-Se膜相似的X射线光电转换效率。在50℃空气退火90分钟后,掺杂4.1 at。%Sb的a-Sc薄膜的X射线衍射(XRD)结果显示没有可检测到的结晶衍射峰。在施加10Vμm〜(-1)的电场时,这种掺Sb的a-Se薄膜的暗电流密度低于1 nA cm〜(-2)。而在约4mGy的X射线剂量下。退火掺Sb的Se膜的光电流密度大于100nA cm〜(-2)

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  • 来源
    《Physica status solidi》 |2013年第3期|580-584|共5页
  • 作者单位

    School of Opto-Electronic Information, University of Electronic Science and Technology of China, 610054 Chengdu, P. R. China;

    School of Opto-Electronic Information, University of Electronic Science and Technology of China, 610054 Chengdu, P. R. China;

    School of Opto-Electronic Information, University of Electronic Science and Technology of China, 610054 Chengdu, P. R. China;

    School of Opto-Electronic Information, University of Electronic Science and Technology of China, 610054 Chengdu, P. R. China;

    School of Opto-Electronic Information, University of Electronic Science and Technology of China, 610054 Chengdu, P. R. China;

    School of Opto-Electronic Information, University of Electronic Science and Technology of China, 610054 Chengdu, P. R. China;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    amorphous selenium; doping; X-ray detectors;

    机译:非晶硒掺杂X射线探测器;

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