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Synthesis of In_2S_(3(1-x))O_(3x) thin films by oxidation of In_2S_3 film and influence of film microstructure

机译:In_2S_3薄膜的氧化及膜微结构的影响合成In_2S_(3(1-x))O_(3x)薄膜

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摘要

In_2S_(3(1-x))O_(3x) is known from preceding studies to have a bandgap varying continuously as a function of x, which is the reason why this solid solution is potentially interesting in the field of photovoltaics. In this work, we present results on oxidation of In_2S_3 by heating in air atmosphere to obtain the desired material. The oxidation is accompanied by a mass loss due to the substitution of S by O atoms that is studied by means of thermogravimetric analysis. It appears that the temperature region in which the oxidation occurs is strongly dependent on the microstructure of deposited films. As-grown films deposited by chemical bath deposition are subjected to nano-oxidation occurring at lower temperature than oxidation of materials that are characterized by a better crystallinity and larger crystallite size. X-ray diffraction and scanning electron microscopy (including energy dispersive X-ray spectroscopy (EDX)) were used to get information on the compounds and the microstructure of films. The main conclusion of the paper opens the perspective of practical applications for producing layers for solar cells.
机译:从先前的研究中已知In_2S_(3(1-x))O_(3x)具有作为x的函数连续变化的带隙,这就是为什么这种固溶体在光伏领域引起潜在兴趣的原因。在这项工作中,我们介绍了通过在大气中加热以获得所需材料而氧化In_2S_3的结果。氧化伴随着质量损失,这是由于通过热重分析研究了O被S原子取代而引起的。似乎发生氧化的温度区域强烈地取决于沉积膜的微观结构。通过化学浴沉积法沉积的成膜薄膜在比具有更好的结晶度和更大的微晶尺寸特征的材料的氧化更低的温度下发生纳米氧化。 X射线衍射和扫描电子显微镜(包括能量色散X射线光谱法(EDX))用于获得有关化合物和薄膜微观结构的信息。本文的主要结论为生产太阳能电池层提供了实际应用的前景。

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