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Thermally stimulated current spectroscopy and photoluminescence of carbon-doped semi-insulating GaN grown by ammonia-based molecular beam epitaxy

机译:氨基分子束外延生长碳掺杂半绝缘GaN的热激发电流光谱和光致发光

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摘要

Semi-insulating GaN samples, grown by ammonia-based molecular beam epitaxy and doped with carbon, were investigated by thermally stimulated current spectroscopy and photoluminescence at 4.2 K. In addition to a dominant trap at 0.90 eV, thought to be related to the N interstitial, a trap at 0.50 eV, presumably related to C_(Ga), was observed in the samples with high carbon concentrations. For all of the carbon-doped samples, strong photoluminescence (PL) bands were observed in the yellow (YL), blue (BL), and near-band-edge regions, with the YL dominating, and the BL decreasing as the carbon concentration increased. Besides the PL and trap properties, the carbon doping also influenced the resistivity and effective carrier lifetime.
机译:通过热激发电流光谱法和4.2 K的光致发光研究了通过氨基分子束外延生长并掺杂了碳的半绝缘GaN样品。除了0.90 eV处的主要陷阱以外,还与N间隙有关在高碳浓度的样品中观察到0.50 eV的陷阱,可能与C_(Ga)有关。对于所有碳掺杂样品,在黄色(YL),蓝色(BL)和近带边缘区域均观察到强光致发光(PL)带,其中YL为主导,BL随着碳浓度的降低而降低增加。除了PL和陷阱性质外,碳掺杂还影响电阻率和有效载流子寿命。

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