...
首页> 外文期刊>Physica Status Solidi. C, Conferences and critical reviews >Below bandgap transitions in an AlGaN/GaN transistor heterostructure observed by photoreflectance spectroscopy
【24h】

Below bandgap transitions in an AlGaN/GaN transistor heterostructure observed by photoreflectance spectroscopy

机译:通过光反射光谱法观察到的AlGaN / GaN晶体管异质结构中的带隙跃迁以下

获取原文
获取原文并翻译 | 示例
           

摘要

Photoreflectance (PR) spectroscopy has been applied to study the optical transitions in an AlGaN/GaN transistor heterostructure at room temperature. A strong PR feature at ~3.37 eV has been observed besides PR features related to the band-to-band absorption in GaN and AlGaN layers. This feature has been attributed to an electron transition between the valence band and a donor-like state located ~50 meV below the conduction band. Such a transition is possible to observe in absorption-type experiment (such as PR spectroscopy) at room temperature because the donor-like state is ionized by the strong electric field existing in GaN layer. The existence of the electric field with a magnitude of ~233 kV/cm has been confirmed by the observation of GaN-related Franz-Keldysh oscillations in the PR spectra.
机译:光反射(PR)光谱已用于研究室温下AlGaN / GaN晶体管异质结构中的光学跃迁。除了与GaN和AlGaN层中的带间吸收有关的PR特性外,还观察到了〜3.37 eV的强PR特性。此特征归因于价带和位于导带下方约50 meV的施主态之间的电子跃迁。由于在GaN层中存在的强电场使施主状被电离,因此在室温下的吸收型实验(例如PR光谱)中可以观察到这种转变。通过在PR光谱中观察到与GaN有关的Franz-Keldysh振荡,已证实存在〜233 kV / cm的电场。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号