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Electrical bistability, negative differential resistance and carrier transport in flexible organic memory device based on polymer bilayer structure

机译:基于聚合物双层结构的柔性有机存储器件的电双稳态,负微分电阻和载流子传输

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Bistable nonvolatile memory devices containing two different layers of polymers, viz. MEH-PPV (poly[2-methoxy-5-(2'-ethyl-hexyloxy)-1,4-phenyl vinylene]) and PEDOT:PSS (poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate)) has been fabricated by a simple spin-coating technique on flexible polyimide (PI) substrates with a structure Al/ MEH-PPV/PEDOT:PSS/Ag-Pd/PI. The current-voltage measurements of the as-fabricated devices showed a nonvolatile electrical bistability with electric field induced charge transfer through the polymer layers and negative differential resistance (NDR) which is attributed to the charge trapping in the MEH-PPV layer. The current ON/OFF ratio between the high-conducting state (ON state) and low-conducting state (OFF state) is found to be of the order of 103 at room temperature which is comparable to organic field effect transistor based memory devices. We propose that such an improvement of rectification ratio (ON/ OFF ratio) is caused due to the inclusion of PEDOT:PSS, which serves as a conducting current path for carrier transport; however, NDR is an effect of the trapped charges in the MEH-PPV electron confinement layer. The device shows excellent stability over 10~4s without any significant degradation under continuous readout testing in both the ON and OFF states. The carrier transport mechanism of the fabricated organic bistable device has been explained on the basis of different conduction mechanisms such as thermionic emission, space-charge-limited conduction, and Fowler-Nordheim tunneling. A band diagram is proposed to explain the charge transport phenomena. These bilayer structures are free from the drawbacks of the single organic layer based memory devices where the phase separation between the nanoparticles and polymers leads to the degradation of device stability and lifetime.
机译:包含两个不同聚合物层的双稳态非易失性存储设备,即。 MEH-PPV(聚[2-甲氧基-5-(2'-乙基-己氧基)-1,4-苯基亚乙烯基])和PEDOT:PSS(聚(3,4-乙撑二氧噻吩):聚(苯乙烯磺酸盐))通过简单的旋涂技术在结构为Al / MEH-PPV / PEDOT:PSS / Ag-Pd / PI的挠性聚酰亚胺(PI)基板上制造。所制造的器件的电流-电压测量结果显示出非易失性双稳态,其中电场感应的电荷通过聚合物层传输,并且负微分电阻(NDR)归因于MEH-PPV层中的电荷俘获。发现在室温下高导通状态(ON状态)和低导通状态(OFF状态)之间的电流开/关比约为103,这与基于有机场效应晶体管的存储器件相当。我们提出,由于包含了PEDOT:PSS,可以提高整流比(开/关比),PEDOT:PSS作为载流子的导电电流路径。但是,NDR是MEH-PPV电子限制层中捕获的电荷的影响。该器件在10到4 s的时间内表现出出色的稳定性,在ON和OFF状态下的连续读出测试下均没有任何明显的劣化。已经基于不同的传导机制,例如热电子发射,空间电荷限制传导和Fowler-Nordheim隧穿,解释了所制造的有机双稳态器件的载流子传输机制。建议使用能带图来解释电荷传输现象。这些双层结构没有基于单个有机层的存储器件的缺点,其中纳米颗粒和聚合物之间的相分离导致器件稳定性和寿命的降低。

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