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首页> 外文期刊>Organic Electronics >Raman characterization and electrical properties of poly(3-hexylthiophene) doped electrochemically in an ionic liquid-gated transistor geometry
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Raman characterization and electrical properties of poly(3-hexylthiophene) doped electrochemically in an ionic liquid-gated transistor geometry

机译:离子液体门控晶体管几何结构中电化学掺杂的聚(3-己基噻吩)的拉曼表征和电性能

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Using Raman spectroscopy, we observed carriers, polarons and bipolarons formed in an ionic-liquid-gated P3HT electrochemical transistor with an ionic liquid [BM1M][TFSI] as a gate dielectric. The relationships between the source-drain current (I_D). the gate voltage (V_G) at a constant source-drain voltage (V_D). and injected charges at each V_G were investigated. An increase in I_D is attributed to the formation of positive polarons, whereas a decrease in I_D corresponded to positive bipolarons. Thus, positive polarons are efficient carriers in P3HT electrochemical transistors. Charge densities, doping levels, electrical conductivities, and mobilities of polarons in P3HT were calculated from the electrochemical measurements. Only positive polarons exist below the dopant level x = 27 mol%, whereas at higher doping levels, polarons and bipolarons coexist. The mobility of polarons was dependent on the doping level. The highest mobility was 0.31 cm~2 V~(-1) s~(-1) at x = 15 mol%.
机译:使用拉曼光谱,我们观察到在以离子液体[BM1M] [TFSI]作为栅极电介质的离子液体门控P3HT电化学晶体管中形成的载流子,极化子和双极化子。源极-漏极电流(I_D)之间的关系。源极-漏极电压(V_D)恒定时的栅极电压(V_G)。并研究了每个V_G的注入电荷。 I_D的增加归因于正极化子的形成,而I_D的降低对应于正双极化子。因此,正极化子是P3HT电化学晶体管中的有效载流子。由电化学测量计算出P3HT中的电荷密度,掺杂水平,电导率和极化子的迁移率。在掺杂剂水平x = 27 mol%以下仅存在正极化子,而在较高掺杂水平下,极化子和双极化子共存。极化子的迁移率取决于掺杂水平。在x = 15 mol%时,最高迁移率是0.31 cm〜2 V〜(-1)s〜(-1)。

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