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首页> 外文期刊>Optics and Lasers in Engineering >Measurements of phase retardation and principal axis angle using an electro-optic modulated Mach-Zehnder interferometer
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Measurements of phase retardation and principal axis angle using an electro-optic modulated Mach-Zehnder interferometer

机译:使用电光调制的Mach-Zehnder干涉仪测量相位延迟和主轴角度

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摘要

This paper presents an electro-optic modulated circular heterodyne modified Mach-Zehnder interferometer and a convenient two-phase signal-processing algorithm for the measurement of variations in the magnitude of phase retardation and the angle of principal axis in optical materials. The developed method solves the problems of normalized intensity jump and limited phase retardation measurement range associated with the circular heterodyne interferometer proposed previously. The present method uses a saw-tooth wave signal to drive an electro-optic (EO) modulator, and employs a lock-in amplifier to demodulate the principal axis angle and the phase retardation. Specifically, this paper considers two main sources of measurement errors, namely the misorientation of the EO modulator and the reflection phase retardation of the beam splitter. Furthermore, the study develops calibration procedures and identifies a means to minimize measurement errors induced by the reflection phase retardation of the beam splitter.
机译:本文提出了一种电光调制圆外差改进型Mach-Zehnder干涉仪和一种方便的两相信号处理算法,用于测量光学材料中相位延迟量和主轴角度的变化。该方法解决了以前提出的圆形外差干涉仪存在的归一化强度跃迁和有限的相位延迟测量范围的问题。本方法使用锯齿波信号来驱动电光(EO)调制器,并采用锁定放大器来解调主轴角度和相位延迟。具体而言,本文考虑了两个主要的测量误差源,即EO调制器的取向错误和分束器的反射相位延迟。此外,该研究开发了校准程序,并确定了一种方法,可最大程度地减少由分束器的反射相位延迟引起的测量误差。

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