Characterization of silicon photodiode-based trap detectors and establishment of spectral responsivity scale

摘要

Spectral responsivity scale was established at National Metrology Institute of Turkey (UME) between 350 and 850 nm wavelength ranges. The scale is based on UME made reflection type trap detector consisting of three single element silicon photodiodes. Various measurements systems were established in order to make optical characterization of trap detectors like linearity, polarization sensivity, uniformity and spectral responsivity. The absolute responsivity linked to the absolute optical power was obtained using improved laser stabilization optics and electrical substitution cryogenic radiometer system at discrete laser wavelengths. Using physical models for the trap detectors, reflectance and internal quantum efficiency the scale was realized with an expanded uncertainty of 0.05%.