...
首页> 外文期刊>Optical Materials >Dopant induced modifications in the microstructure and nonlinear optical properties of 4N4MSP chalcone doped PVA films
【24h】

Dopant induced modifications in the microstructure and nonlinear optical properties of 4N4MSP chalcone doped PVA films

机译:掺杂剂对4N4MSP查尔酮掺杂PVA薄膜的微观结构和非线性光学性质的修饰

获取原文
获取原文并翻译 | 示例
           

摘要

4M4MSP doped PVA films were prepared with dopant concentrations of 0.1, 0.25, 0.5, 0.75 and 1.0 wt% by solution casting method. From the study of FTIR spectra of the films the molecular structure was confirmed by the frequency vibrations corresponding to functional group bonding. The frequency shift in the molecular bonding establishes the possibility of formation of charge transfer complexes (CTC). UV-Visible spectra were utilized for following investigations viz: observed the shift in the absorption peaks to the higher wavelength region; decrease in the optical band gap energy from 5.02 (for pure PVA) to 2.33eV, the enhancement in the dielectric constant from 3 (for pure PVA) to 7 in the visible region; and the shift in the dielectric loss towards shorter wavelength upon increase in the dopant concentration. The studies of powder XRD spectrum explore the increase of amorphous nature of the film with the increase of dopant. From the fluorescence spectrum it is observed that fluorescence peak intensity increases up to 0.5 wt% of dopant concentration and for higher concentration it decreases. The significantly superior nonlinear absorption and refraction parameters (similar to 10(-10) cm/W and similar to 10(11) esu, respectively) of the composite compared with pure PVA obtained from the femtosecond Z-scan technique suggests the possibility of the composite to be useful in photonics/opto-electronics applications.
机译:通过溶液流延法制备掺杂浓度为0.1、0.25、0.5、0.75和1.0重量%的4M4MSP掺杂的PVA膜。从薄膜的FTIR光谱研究中,通过对应于官能团键合的频率振动确认了分子结构。分子键中的频移确定了形成电荷转移络合物(CTC)的可能性。紫外可见光谱用于以下研究,即:观察到吸收峰向较高波长区域的移动;光带隙能量从5.02(纯PVA)降低到2.33eV,介电常数从3(纯PVA)提高到可见光区域的7。并且随着掺杂剂浓度的增加,介电损耗向更短的波长移动。粉末XRD光谱的研究探索了膜的无定形性质随掺杂剂的增加而增加。从荧光光谱中观察到,荧光峰强度增加到掺杂剂浓度的0.5重量%,而对于更高的浓度,荧光峰强度降低。与飞秒Z扫描技术获得的纯PVA相比,复合材料具有明显优越的非线性吸收和折射参数(分别类似于10(-10)cm / W和类似于10(11)esu),这提示了这种可能性复合材料可用于光子学/光电应用。

著录项

  • 来源
    《Optical Materials》 |2020年第3期|109708.1-109708.10|共10页
  • 作者单位

    St Philomena Coll Post Grad Dept Phys Puttur 574202 Karnataka India;

    Manipal Acad Higher Educ Manipal Inst Technol Dept Phys Manipal 576104 Karnataka India;

    Univ Hyderabad Sch Phys Prof CR Rao Rd Hyderabad 500046 Telangana India;

    Univ Hyderabad ACRHEM Prof CR Rao Rd Hyderabad 500046 Telangana India;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    PVA; Nonlinear optics; Fluorescence; Charge transfer complexes; Powder XRD; Z-scan;

    机译:PVA;非线性光学荧光;电荷转移复合物;粉末XRD;Z扫描;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号