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机译:相位误差分析和相位测量偏转法的减少
University of Electronic Science and Technology of China, School of Optoelectronic Information, State Key Laboratory of Electronic Thin Films and Integrated Devices, Chengdu 610054, China;
University of Electronic Science and Technology of China, School of Optoelectronic Information, State Key Laboratory of Electronic Thin Films and Integrated Devices, Chengdu 610054, China;
University of Electronic Science and Technology of China, School of Optoelectronic Information, State Key Laboratory of Electronic Thin Films and Integrated Devices, Chengdu 610054, China;
University of Electronic Science and Technology of China, School of Optoelectronic Information, State Key Laboratory of Electronic Thin Films and Integrated Devices, Chengdu 610054, China;
University of Electronic Science and Technology of China, School of Optoelectronic Information, State Key Laboratory of Electronic Thin Films and Integrated Devices, Chengdu 610054, China;
deflectometry; fringe analysis; phase retrieval; noise; metrology;
机译:误差表面形状特征及相位测量偏转尺寸系统空间姿态变化的试验研究
机译:相位测量偏转仪中测量梯度模型的测量误差和范围研究
机译:边缘偏转测量系统的非线性相位误差补偿
机译:相位测量偏转测量中相移边缘的非线性误差的补偿
机译:自由曲面的相位测量偏转法的仿真
机译:用于相位测量偏转测量系统的精确校准装置
机译:基于局部模糊分析的三维镜面测量阶段测量偏转系统