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Stabilization of synthetic wavelength using offset-frequency locking for the measurement accuracy improvement of the laser synthetic wavelength interferometer

机译:使用偏移频率锁定来稳定合成波长,以提高激光合成波长干涉仪的测量精度

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摘要

In the laser synthetic wavelength interferometer (LSWI), enhancing the stability of the synthetic wavelength is very important for the improvement of displacement measurement accuracy. A synthetic wavelength stabilization scheme using offset-frequency locking for LSWI is proposed. By locking an external cavity diode laser to the +3rd sideband of an I_2 frequency-stabilized He-Ne laser modulated with an electro-optic modulator, a stabilized large synthetic wavelength with frequency difference of 815 MHz can be obtained for LSWI. The optical configuration and principle of offset-frequency locking is described in detail. The experiments of frequency stability and displacement measurement were carried out to demonstrate the feasibility and effectiveness of the proposed scheme. Frequency stability experimental results show that the relative stability of the frequency difference between the two lasers is about 1.84 × 10~(-11) at 1 s averaging time. Nanometer and micrometer displacement measurement results show that subnanometer accuracy can be realized. These results indicate that the proposed scheme is able to evidently improve the displacement measurement accuracy of LSWI.
机译:在激光合成波长干涉仪(LSWI)中,增强合成波长的稳定性对于提高位移测量精度非常重要。提出了一种采用偏频锁相的LSWI合成波长稳定方案。通过将外腔二极管激光器锁定在用电光调制器调制的I_2频率稳定的He-Ne激光器的+3边带上,可以为LSWI获得稳定的大合成波长,其频差为815 MHz。详细描述了频偏锁定的光学结构和原理。进行了频率稳定性和位移测量实验,证明了该方案的可行性和有效性。频率稳定性实验结果表明,平均时间为1 s时,两个激光器的频率差的相对稳定性约为1.84×10〜(-11)。纳米和微米位移测量结果表明,可以实现亚纳米精度。这些结果表明,该方案能够明显提高LSWI的位移测量精度。

著录项

  • 来源
    《Optical engineering》 |2018年第3期|034106.1-034106.7|共7页
  • 作者单位

    Zhejiang Sci-Tech University, Nanometer Measurement Laboratory, Xiasha High-Education Zone, Hangzhou, China;

    Zhejiang Sci-Tech University, Nanometer Measurement Laboratory, Xiasha High-Education Zone, Hangzhou, China;

    Zhejiang Sci-Tech University, Nanometer Measurement Laboratory, Xiasha High-Education Zone, Hangzhou, China;

    Zhejiang Sci-Tech University, Nanometer Measurement Laboratory, Xiasha High-Education Zone, Hangzhou, China;

    Zhejiang Sci-Tech University, Nanometer Measurement Laboratory, Xiasha High-Education Zone, Hangzhou, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    interferometry; synthetic wavelength interferometer; offset-frequency locking; subnanometer accuracy;

    机译:干涉测量合成波长干涉仪频偏锁定亚纳米精度;

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