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首页> 外文期刊>Optical and quantum electronics >Time resolved applied electric field masking in photorefractive semiconductors
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Time resolved applied electric field masking in photorefractive semiconductors

机译:时间分辨光折射半导体中的施加电场屏蔽

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We propose a theoretical analysis of the temporal self-focusing phenomena in the iron-doped indium phosphide (InP: Fe) semiconductor for low irradiations with continuous laser beams at infrared wavelengths for optical telecommunication applications such as optical switching and optical routing. Numerical models using two different methods based on charge transport equations are developed. The first method uses the classical finite differences scheme whereas the second method uses a novel algorithm based on Cellular Automata. Owing to the complexity of the non-linear differential system to be solved, full results are not retrieved but promising preliminary results are obtained and reviewed in this paper: they allow us to foresee that self-focusing on the millisecond time scale is possible in InP: Fe.
机译:我们提出了一种理论上的分析,说明了铁掺杂的磷化铟铟(InP:Fe)半导体中的时间自聚焦现象,用于在红外波长下对连续激光束进行低辐照,以进行光通信应用,例如光交换和光路由。建立了基于电荷传输方程使用两种不同方法的数值模型。第一种方法使用经典的有限差分方案,而第二种方法使用基于Cellular Automata的新颖算法。由于要解决的非线性微分系统的复杂性,无法获得全部结果,但是本文获得了有希望的初步结果并进行了综述:它们使我们可以预见,在InP中可以以毫秒为单位进行自我关注:铁

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