...
【24h】

Bulk and track etch properties of CR-39 SSNTD etched in NaOH/ethanol

机译:在NaOH /乙醇中腐蚀的CR-39 SSNTD的整体和轨迹腐蚀性能

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

Recently, Matiullah et al. described the use of NaOH/ethanol as an etchant for the CR-39 detector, and have determined the corresponding bulk and track etch properties from the track diameter method. In the present work, the bulk and track etch properties of CR-39 in NaOH/ethanol were derived from direct measurements. The bulk etch rate has been found to increase with the molarity of NaOH/ ethanol, reach a maximum at ~2.5 N and start to drop beyond 3 N. The bulk etch rate also increases with stirring. These phenomena can be explained by the insulation of the detector from the etchant by the etched products. Regarding the track etch, we have found a surprising result that the lengths of (pre-etched) tracks are actually shortened when the tracks are etched in NaOH/ethanol. Generally speaking, the remaining track depths obtained with stirring are longer than those for no stirring. The shortening of the tracks can be explained by the insulation of the pre-etched track wall from the etchant with the etched products.
机译:最近,Matiullah等。美国专利No.5,775,404描述了使用NaOH /乙醇作为CR-39检测器的蚀刻剂,并已通过轨道直径法确定了相应的体积和轨道蚀刻性能。在当前的工作中,CR-39在NaOH /乙醇中的体积和轨迹蚀刻性能是直接测量得出的。已经发现,随着NaOH /乙醇的摩尔浓度,整体蚀刻速率增加,在〜2.5N时达到最大值,并且开始下降到超过3N。随着搅拌,整体蚀刻速率也增加。这些现象可以通过检测器与被蚀刻产物与蚀刻剂的绝缘来解释。关于磁道蚀刻,我们发现了一个令人惊讶的结果,即当在NaOH /乙醇中蚀刻磁道时,实际上缩短了(预蚀刻)磁道的长度。一般而言,通过搅拌获得的剩余轨迹深度比不搅拌时更长。可以通过将预蚀刻的轨道壁与蚀刻剂与蚀刻的产品绝缘来解释轨道的缩短。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号