Improved detection limits in PIXE analysis employing wavelength dispersive X-ray spectroscopy

摘要

A wavelength dispersive X-ray spectroscopy was employed to measure the proton induced La X-ray emission spectra of Ag, Pd and Cd targets in order to lower detection limits for trace amounts of Pd and Cd in silver matrix. The measurements were performed with a Johansson-type crystal spectrometer having an energy resolution below the natural linewidths of the measured L X-ray lines. As a direct consequence of such ultrahigh experimental energy resolution, detection limits of only few tens of ppm were reached. The method presented in this work can be used in general to improve substantially PIXE detection limits compared to standard energy dispersive spectroscopy for the measurement of trace elements with atomic number in the close vicinity of the atomic number of the target matrix element.