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Massive-scale molecular dynamics of ion-irradiated III—V compound semiconductors at the onset of nanopatterning

机译:纳米构图开始时离子辐照的III-V族化合物半导体的大规模分子动力学

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摘要

Large-scale atomistic computational modeling is critical to developing a fundamental understanding of the driving mechanisms behind ion beam-induced pattern formation on HI—V compound semiconductor surfaces. Existing theoretical efforts fail to account for the existence of compositional depth profiles, as observed in experiments, which evolve over time and contribute to the development of lateral compositional instabilities. Another critical knowledge gap in existing theories is the a priori selection of ion-driven compositional mechanisms, so that different models predict the same surface morphology for radically different surface compositions. Atomistic simulations can elucidate key ion-induced compositional mechanisms leading to nonequilibrium compositional depth profiles. Such simulations must be performed on large length scales to enable connection of depth compositional mechanisms to lateral instabilities which ultimately drive patterning. To address these essential knowledge gaps, a 100×100 nm~2 GaSb surface was constructed for molecular dynamics simulations with altered composition based on experimental data at the pattern threshold fluence. The surface was then bombarded with 500 eV Kr~+ ions to a differential fluence of 8.4 × 10~(13) cm~(-2). In Ga-enriched (Sb-enriched) regions, clusters of Ga (Sb) are observed to form. While the Ga clusters remain amorphous, Sb clusters rapidly crystallize. The crystallization is not directly ion-induced but rather an intrinsic material behavior of pure Sb in response to the ion-induced compositional instability in the surface. To elucidate the ion-driven compositional changes leading to this state, 25 x 25 nm~2 "pristine" 50-50 GaSb crystalline surfaces were irradiated with 500 eV Ne~+, Ar~+, and Kr~+ to fluences on the order of 10~(16)cm~(-2). The ion-induced displacement cascade tends to lead to formation of Sb nanoclusters, while Ga rarely forms clusters but readily bonds to the Sb clusters. While initially the clustering behavior is the same for all ion species, for continued Kr~* irradiation the clusters become less prevalent within the material surface.
机译:大规模原子计算模型对于对HI-V化合物半导体表面上离子束诱导的图形形成背后的驱动机理有一个基本的了解至关重要。正如在实验中观察到的那样,现有的理论努力无法解释存在的成分深度剖面,该深度会随着时间的推移而发展,并导致横向成分不稳定性的发展。现有理论中另一个重要的知识鸿沟是离子驱动成分机制的先验选择,因此对于根本不同的表面成分,不同的模型可以预测相同的表面形态。原子模拟可以阐明导致非平衡成分深度分布的关键离子诱导的成分机制。这样的模拟必须在大尺度上进行,以使深度合成机制与横向不稳定性连接起来,从而最终驱动图案化。为了解决这些重要的知识空白,基于模式阈值注量下的实验数据,构建了一个100×100 nm〜2 GaSb表面用于分子动力学模拟,其分子组成发生了变化。然后用500 eV Kr〜+离子轰击该表面,使通量密度达到8.4×10〜(13)cm〜(-2)。在富含Ga(Sb)的区域中,观察到形成了Ga(Sb)簇。当Ga团簇保持非晶态时,Sb团簇迅速结晶。结晶不是直接由离子诱导的,而是响应于离子诱导的表面成分不稳定性,纯Sb的固有材料行为。为了阐明导致这种状态的离子驱动的组成变化,用500 eV Ne〜+,Ar〜+和Kr〜+辐照25 x 25 nm〜2个“原始的” 50-50 GaSb晶体表面,使其达到一定量级。约10〜(16)cm〜(-2)离子诱导的位移级联趋向于导致Sb纳米簇的形成,而Ga很少形成簇,但易于与Sb簇键合。尽管最初所有离子物种的聚集行为都相同,但是对于连续的Kr〜*辐照,这些簇在材料表面的分布变得不那么普遍。

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  • 作者单位

    Department of Nuclear, Plasma, and Radiological Engineering, University of Illinois at Urbana-Champaign, IL, USA;

    Department of Nuclear, Plasma, and Radiological Engineering, University of Illinois at Urbana-Champaign, IL, USA,Micro and Nanotechnology Laboratory, University of Illinois at Urbana-Champaign, IL, USA;

    Department of Nuclear, Plasma, and Radiological Engineering, University of Illinois at Urbana-Champaign, IL, USA,Department of Materials Science and Engineering University of Illinois at Urbana-Champaign, IL, USA;

    Department of Nuclear, Plasma, and Radiological Engineering, University of Illinois at Urbana-Champaign, IL, USA,Micro and Nanotechnology Laboratory, University of Illinois at Urbana-Champaign, IL, USA,Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, IL, USA;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Nanopatterning; Ion beam nanosynthesis; HI—V semiconductors; Molecular dynamics;

    机译:纳米图案离子束纳米合成;HI-V半导体;分子动力学;

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