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A new family of pixel detectors for high frame rate X-ray applications

机译:适用于高帧率X射线应用的新像素检测器系列

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摘要

We are developing a new family of hybrid, single photon counting X-ray detectors for very high frame rate applications. A dedicated readout chip was designed, to be used as building block for detectors up to 9 Mpixel and about 550 cm~2 area. It has an area of 19.3 × 20.0 mm~2 and contains 256 × 256 pixels of 75 × 75 μm~2, resulting in an active region of 19.2 × 19.2 mm~2. Each pixel contains a 12 bit counter with double buffering for continuous image acquisition. Moreover, it allows a partial readout (4.8 or 12 bits) with corresponding frame rates up to 24,12 and 8 kHz. The chip is designed with Hardening By Design techniques [1], to obtain high radiation tolerance from a standard commercial 0.25 μm CMOS technology. The chip was recently received from fabrication and it is at present under test.
机译:我们正在开发一种新的混合,单光子计数X射线探测器系列,适用于非常高的帧频应用。设计了专用的读取芯片,用作高达9 Mpixel和约550 cm〜2面积的探测器的构造块。它的面积为19.3×20.0 mm〜2,包含256×256像素的75×75μm〜2,从而形成了19.2×19.2 mm〜2的有效区域。每个像素包含一个带有双缓冲的12位计数器,用于连续图像采集。此外,它允许以高达24.12和8 kHz的相应帧速率进行部分读出(4.8或12位)。该芯片采用“设计硬化”技术[1]进行设计,以从标准的0.25μmCMOS技术获得高辐射耐受性。该芯片是最近从制造中收到的,目前正在测试中。

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