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Recent results on 3D double sided detectors with slim edges

机译:具有纤细边缘的3D双面探测器的最新结果

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This paper reports on the first characterization of double sided 3D silicon radiation pixel detectors with slim edges. These detectors consist of a three-dimensional array of electrodes that penetrate into the detector bulk with the anode and cathode electrodes etched from opposite sides of the substrate. Different detectors were post-processed using the scribe-cleave-passivate (SCP) technology to make "slim edge" sensors. These sensors have only a minimal amount of inactive peripheral region, for the benefit of the construction of large-area tracker and imaging systems. The target application for this work is the use of 3D slim edge detectors for the ATLAS Forward Physics (AFP) CERN Project, where pixel detectors for position resolution and timing detectors for removal of pile up protons, will be placed as close as possible to the beam to detect diffractive protons at 220 m on either side of the ATLAS interaction point. For this reason the silicon areas should feature the narrowest possible insensitive zone on the sensor edge closest to the beam and withstand high nonuniform irradiation fluences.
机译:本文报道了具有细长边缘的双面3D硅辐射像素探测器的第一个特性。这些检测器由三维阵列的电极组成,这些电极穿透到检测器主体中,阳极和阴极电极从基板的相对侧蚀刻。使用划线切割钝化(SCP)技术对不同的检测器进行后处理,以制造“细长边缘”传感器。这些传感器仅具有最少量的非活动外围区域,这有利于构建大面积跟踪器和成像系统。这项工作的目标应用是在ATLAS前向物理(AFP)CERN项目中使用3D超薄边缘检测器,其中位置检测用像素检测器和去除堆积质子的定时检测器应尽可能靠近检测器放置。光束以检测ATLAS相互作用点任一侧220 m处的衍射质子。因此,硅区域应在最靠近光束的传感器边缘上具有尽可能窄的不敏感区域,并能承受较高的不均匀辐照通量。

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