Inspection of defects in conductive multi-layered structures by an eddy current scanning technique: Simulation and experiments

摘要

The forward problem of eddy current detection of defects by scanning conductive multi-layered structures is investigated and the change of the probe coil impedance is modeled by using finite element analysis method. Based on the ANSYS software a fast simulating program is developed and then the coil impedance changes due to the existing of defects in different lengths, shapes and at different locations in conductive multi-layers are calculated. An experimental eddy current testing system combined with a scanner is established and scanning testing experiments are carried out. The simulation and experimental results are compared. The agreement of them shows that the technique studied is promising and can help us to understand the probe responses and can be applied to the inversion model to determine the defect parameters in many important fields ranging from aerospace to energy and transportation industries.