机译:明确考虑缺陷的长度和深度来证明检测概率
Department of Quantum Science and Energy Engineering, Graduate School of Engineering, Tohoku University, 6-6-01-2, Aramaki Aza Aoba, Aoba, Sendai, Miyagi 980-8579, Japan;
Department of Quantum Science and Energy Engineering, Graduate School of Engineering, Tohoku University, 6-6-01-2, Aramaki Aza Aoba, Aoba, Sendai, Miyagi 980-8579, Japan;
Department of Quantum Science and Energy Engineering, Graduate School of Engineering, Tohoku University, 6-6-01-2, Aramaki Aza Aoba, Aoba, Sendai, Miyagi 980-8579, Japan;
Crack; Surface examination; Statistical analysis; Eddy current testing; Finite element method; Nondestructive testing and evaluation;
机译:在明确考虑到缺陷的长度和深度的情况下证明检测概率
机译:使用显式动态XFEM和吸收边界层的扫掠窗口方法来检测缺陷
机译:探险探测探测模型的概率探讨了多个相关变量的缺陷
机译:考虑概率检测概率(POD)轴承座上轴缺损的超声波检查
机译:用于亚波长缺陷检测和成像的可大规模并行化的近场传感器的可行性演示。
机译:补偿探测概率随水深的地理变化可改善沿海海洋大型动物群的丰度估计
机译:超声波检测新漏洞深度施胶技术的研制(第3次报告,衍射技术短路的演示)
机译:非破坏性评估设备中探伤的概率和误报的概率