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Demonstration of probability of detection taking consideration of both the length and the depth of a flaw explicitly

机译:明确考虑缺陷的长度和深度来证明检测概率

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摘要

This study proposes the construction of the probability of detection (POD) as a function of both the depth and length of a flaw. In addition, this study discusses how to censor signals in constructing the POD. The general effects of the flaw parameters on signals are evaluated by numerical simulations, and the scattering of signals, which is critical to the POD, is estimated by signals obtained in experiments. A new likelihood function is introduced, and the proposed method is demonstrated using eddy current signals caused by various artificial flaws on a flat type 316L stainless steel plate obtained in a laboratory test. The demonstration confirms that the proposed method can provide a reasonable POD with a small amount of experimental signals, and reveals that proper censoring significantly decreases the detrimental effect of noise on the POD.
机译:这项研究提出了构造探伤概率(POD)的方法,探伤概率是缺陷深度和长度的函数。此外,本研究还讨论了在构建POD时如何审查信号。通过数值模拟评估缺陷参数对信号的一般影响,并通过实验获得的信号估算对POD至关重要的信号散射。介绍了一种新的似然函数,并利用由实验室测试获得的平板型316L不锈钢板上各种人为缺陷引起的涡流信号对所提出的方法进行了演示。演示证实了所提出的方法可以通过少量的实验信号提供合理的POD,并揭示出适当的检查显着降低了噪声对POD的有害影响。

著录项

  • 来源
    《NDT & E international》 |2016年第7期|1-8|共8页
  • 作者单位

    Department of Quantum Science and Energy Engineering, Graduate School of Engineering, Tohoku University, 6-6-01-2, Aramaki Aza Aoba, Aoba, Sendai, Miyagi 980-8579, Japan;

    Department of Quantum Science and Energy Engineering, Graduate School of Engineering, Tohoku University, 6-6-01-2, Aramaki Aza Aoba, Aoba, Sendai, Miyagi 980-8579, Japan;

    Department of Quantum Science and Energy Engineering, Graduate School of Engineering, Tohoku University, 6-6-01-2, Aramaki Aza Aoba, Aoba, Sendai, Miyagi 980-8579, Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Crack; Surface examination; Statistical analysis; Eddy current testing; Finite element method; Nondestructive testing and evaluation;

    机译:裂纹;表面检查;统计分析;涡流检测;有限元法;无损检测与评估;

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