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Rough surface reconstruction of real surfaces for numerical simulations of ultrasonic wave scattering

机译:用于超声散射数值模拟的真实表面的粗糙表面重建

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The scattering of waves by rough surfaces plays a significant role in many fields of physical sciences including ultrasonics where failure surfaces are often rough and their accurate identification is critical. The prediction of the strength of scattering can be hampered when the roughness is not adequately characterised and this is a particular issue when the surface roughness is within an order of the incident wavelength. Here we develop a methodology to reconstruct, and accurately represent, rough surfaces using an AutoRegressive (AR) process that then allows for rapid numerical simulations of ultrasonic wave rough surface scattering in three dimensions. Gaussian, exponential and AR surfaces are reconstructed based on real surface data and the statistics of the surfaces are compared with each other. The statistics from the AR surfaces agree well with those from actual rough surfaces, taken from experimental samples, in terms of the heights as well as the gradients, which are the two main factors in accurately predicting the wave scattering intensities. Ultrasonic rough surface scattering is simulated numerically using the Kirchhoff approximation, and comparisons with Gaussian, exponential, AR and real sample surfaces are performed; scattering intensities found using AR surfaces show the best agreement with the real sample surfaces.
机译:粗糙表面对波的散射在包括超声在内的许多物理科学领域中都起着重要作用,在超声领域,失效表面通常是粗糙的,因此对它们的精确识别至关重要。当不充分表征粗糙度时,会妨碍对散射强度的预测,而当表面粗糙度在入射波长的数量级内时,这是一个特别的问题。在这里,我们开发了一种使用自动回归(AR)流程重建和精确表示粗糙表面的方法,然后可以对三维粗糙表面的超声波散射进行快速数值模拟。基于真实表面数据重建高斯,指数和AR表面,并将表面统计信息进行比较。在高度和梯度方面,AR表面的统计数据与从实验样品中获取的实际粗糙表面的统计数据非常吻合,这是准确预测波散射强度的两个主要因素。使用基尔霍夫近似对超声粗糙表面散射进行数值模拟,并与高斯,指数,AR和真实样品表面进行比较;使用AR表面发现的散射强度显示出与真实样品表面的最佳一致性。

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